Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. Volume I covers the instrumentation, sample preparation, fundamental diffraction, imaging, analytical microscopy, and some newly developed microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.
A Practical Guide to Transmission Electron Microscopy, Volume II Advanced Microscopy PDF Free Download
You may also like
This title is a Pearson Global Edition. The Editorial team at Pearson has worked closely with educators around the world to include content which is especially...
This new book, from the editor of the highly successful Pharmaceutical Analysis, sets out to define the area of pharmaceutical chemistry as distinct from...
The second edition of Analytical Methods in Supramolecular Chemistry comes in two volumes and covers a broad range of modern methods and techniques now used...
Add Comment